X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1990-06-01
1991-09-17
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Lithography
378 97, 378108, 378207, 7502521, H05G 126
Patent
active
050501968
ABSTRACT:
An X-ray aligner provided with a radiation gauge for detecting an intensity of the X-ray radiation. The sensitivity of the radiation gauge is influenced by the passed exposure, the passed non-exposure period and/or the time elapsed. The sensitivity change is compensated by the present invention. Thus, the correct exposure can be provided.
REFERENCES:
patent: 3275831 (1966-09-01), Martin
patent: 3600584 (1971-08-01), Schneble
patent: 4021675 (1977-05-01), Shifrin
patent: 4061829 (1977-12-01), Taylor
patent: 4301237 (1981-11-01), Burns
patent: 4369370 (1983-01-01), Spohr
patent: 4562586 (1985-12-01), Honda et al.
Kadosawa Tsuneaki
Korenaga Nobushige
Canon Kabushiki Kaisha
Fields Carolyn E.
Porta David P.
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