Process for fabricating semiconductor integrated circuit device,

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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430396, 2504921, G03F 700

Patent

active

057534160

ABSTRACT:
Herein disclosed is an exposure technology for a semiconductor integrated circuit device which has a pattern as fine as that of an exposure wavelength. The technology contemplates to improve the resolution characteristics of the pattern by making use of the mutual interference of exposure luminous fluxes.

REFERENCES:
patent: 4153457 (1979-05-01), Kellie
patent: 5266446 (1993-11-01), Chang et al.

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