Method and apparatus for testing an unpopulated chip carrier usi

Details Method and apparatus for testing an unpopulated chip carrier usi Method and apparatus for testing an unpopulated chip carrier usi

1992-08-12

1994-11-08

Arana, Louis

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

439 86, G01R 104

Patent

active

053630386

ABSTRACT:
Manufacturing of semiconductor devices is facilitated when the device chip carriers of the devices are tested, prior to population of chips thereon, by a module test card. The module test card is formed by a test substrate and a plurality of test chips mounted on the test substrate. Connections are provided on the test substrate for connecting to a tester. Through the module test card, the device chip carriers are tested under simulation of their operating conditions.

REFERENCES:
patent: 3634807 (1972-02-01), Grobe
patent: 3746973 (1973-07-01), McMahon, Jr.
patent: 4912401 (1990-03-01), Nady, II et al.
patent: 4937203 (1990-06-01), Eichelberger et al.
patent: 5007163 (1991-04-01), Pope et al.
patent: 5046953 (1991-09-01), Shreeve et al.
patent: 5049084 (1991-09-01), Bakke
patent: 5053698 (1991-10-01), Ueda

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