Method for fabricating ohmic electrode and multi-layered structu

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438605, 438606, 438602, H01L21/28

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active

059045540

ABSTRACT:
An ohmic electrode for III-V compound semiconductors such as GaAs semiconductors which has practically satisfactory characteristics is disclosed. A non-single crystal InAs layer, Ni film, WSi film and W film are sequentially deposited on an n.sup.+ -type GaAs substrate by sputtering, etc. and subsequently patterned by lift-off, etc. to make a multi-layered structure for fabricating ohmic electrodes. The structure is then annealed first at, e.g. 300.degree. C. for 30 minutes and next at, e.g. 650.degree. C. for one second to fabricate an ohmic electrode.

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Journal of Applied Physics, vol. 68, No. 5, Sep. 1, 1990, pp. 2475-2481, XP00001408786, "Thermally Stable Ohmic Contacts to N-Type GaAs. VIII. Sputter Deposited InAs Contacts".
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Chemical Abstracts, vol. 115, No. 1, "Thermally stable, low-resistance indium-based ohmic contacts to n -and p -type gallium arsenide", 115:19498h, Murakami et al., Jul. 8, 1991.
American Institute of Physics, Apol. Phys. Lett. 49 (22), Dec. 1, 1986, "in situ contacts to GaAs based on InAs", S.L. Wright et al., pp. 1545-1546.
American Institute of Physics, J. Appl. Phys. 68 (5), Sep. 1, 1990, "Thermally stable ohmic contact to n-type GaAs. VIII. Addition of Ge or Si to NilnW ohmic contacts", Murakami et al., pp. 2468-2474.

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