Semiconductor contact via structure and method

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 68, 357 65, H01L 2348

Patent

active

050703919

ABSTRACT:
A contact opening through an insulating layer is filled with metal and etched back to form a metal plug within the opening. A metal interconnect line can then be formed over the contact, and makes electrical contact with the metal plug. Since the contact opening is filled by the metal plug, it is not necessary for the metal signal line to have a widened portion in order to ensure enclosure.

REFERENCES:
patent: 4837609 (1989-06-01), Gurvitch
patent: 4887146 (1989-12-01), Hinode

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor contact via structure and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor contact via structure and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor contact via structure and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1699726

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.