Operational analysis device of the scan path type having a singl

Details Operational analysis device of the scan path type having a singl Operational analysis device of the scan path type having a singl

1991-10-22

1993-07-06

Westin, Edward P.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

371 223, 3072722, 307465, 324 731, G01R 3128, G08F 1100, H03K 19096

Patent

active

052257240

ABSTRACT:
The device comprises a first chain of scanning cells located at the stimulation input of each respective functional block of the integrated circuit and a second chain of scanning cells located at the assessment output of each respective functional block of the integrated circuit. Each cell comprises a master part, a slave part and switching circuit to alternately enable the master and slave parts under the control of respective master clock and slave clock signals coincident with opposite phases of a scanning clock signal having a substantially square wave. With each pair of chains of scanning cells there are associated clock generators to locally obtain the master and slave clocks from the scanning clock.

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patent: 4995039 (1991-02-01), Sakashita et al.
patent: 5032783 (1991-07-01), Hwang et al.
patent: 5130647 (1992-07-01), Sakashita et al.

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