Method of and device for inspecting a PCB

Details Method of and device for inspecting a PCB Method of and device for inspecting a PCB

1997-07-14

1999-11-30

Font, Frank G.

Optics: measuring and testing

By configuration comparison

With relatively movable optical grids

356373, 356385, G01B 1100

Patent

active

059952326

ABSTRACT:
A quantity of material is locally deposited on or removed from a substantially flat substrate of a circuit board. The quantity is inspected by carrying out a first measurement of a level of a surface of the material in a direction transversely of the substrate. At least two further measurements are performed of a further level of the substrate in said direction in at least two further locations where the material has not been deposited or removed. A reference level of the substrate is calculated by interpolation between the further measurements to a location of the first measurement. The quantity of material is inspected on the basis of a difference between the first measurement and the reference level.

REFERENCES:
patent: 4269515 (1981-05-01), Altman
patent: 4978224 (1990-12-01), Kishimioto et al.
patent: 5011950 (1991-04-01), Fukuoka et al.
patent: 5011960 (1991-04-01), Ando et al.
patent: 5166753 (1992-11-01), Tokura
patent: 5329359 (1994-07-01), Tachikawa
patent: 5572313 (1996-11-01), Zheng et al.

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