Scanning electron microscope with a chamber which can be broken

Details Scanning electron microscope with a chamber which can be broken Scanning electron microscope with a chamber which can be broken

1980-05-29

1982-01-26

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

250441, G21K 510

Patent

active

043130569

ABSTRACT:
An electron microscope including a base, a frame supported by said base, a vacuum chamber supported by said frame and including a fixed cup-shaped member having a lateral aperture closed by a movable cover, the latter including a further interchangeable cup-shaped member with its concavity facing said aperture, and supported by substantially horizontal guide means rigid with said frame for moving from and towards said fixed cup-shaped member; support means being provided inside said further cup-shaped member for supporting a piece holder in an adjustable position.

REFERENCES:
patent: 408830 (1943-05-01), Borries et al.
patent: 2627580 (1953-02-01), Picard

Affiliated with

Also associated with

Rating

Scanning electron microscope with a chamber which can be broken does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning electron microscope with a chamber which can be broken , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning electron microscope with a chamber which can be broken will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1668048