Semiconductor integrated circuit device with built-in regulating

Details Semiconductor integrated circuit device with built-in regulating Semiconductor integrated circuit device with built-in regulating

1994-07-05

1995-09-26

Popek, Joseph A.

Static information storage and retrieval

Read/write circuit

Testing

365203, G11C 700

Patent

active

054539544

ABSTRACT:
A regulating system incorporated in a static type random access memory device store control data codes indicative of margins between actual circuit characteristics of a charging circuit and a sense amplifier and standard circuit characteristics thereof in a rewritable manner, and the control data codes are given to the regulating system through a testing operation before delivery from a factory for enhancing the device characteristics and the production yield.

REFERENCES:
patent: 4970727 (1990-11-01), Miyawaki
patent: 5142495 (1992-08-01), Canepa
A. Tanabe et al., "A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function", IEEE Journal of Solid-State Circuits, vol. 27, No. 11, Nov. 1992, pp. 1525-1533.

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