Method for interconnecting the active zones and/or the gates of

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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29571, 29591, 148187, 156646, 156653, 156656, 1566591, 156662, 357 231, 357 41, 357 67, 357 71, 427 88, 427 90, C23F 102, B44C 122, C03C 1500, C03C 2506

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active

046327258

ABSTRACT:
A method for interconnecting the active zones and/or the gates of a C/MOS integrated circuit characterized in that, after producing the constituent elements of the integrated circuit with the exception of the connections, on the complete circuit is directly deposited a coating of a conductive material, which is then etched in order to form the desired connection.

REFERENCES:
patent: 4111725 (1978-09-01), Cho et al.
patent: 4267012 (1981-05-01), Pierce et al.
patent: 4432133 (1984-02-01), Furuya
patent: 4461071 (1984-07-01), Poleshuk
patent: 4478679 (1984-10-01), Chang et al.
Miller, Nicholas E. et al., "CVD Tungsten Interconnect and Contact Barrier Technology for VLSI", Solid State Technology, vol. 25, Dec. 1982, pp. 85-90.

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