Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of...
Patent
1996-10-17
1999-01-12
Gupta, Yogendra N.
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
438694, 438906, H01L 2100
Patent
active
058588817
ABSTRACT:
A method of producing a high-purity and high-quality thin film, wherein chlorine trifluoride is used as a cleaning gas for the purpose of lowering temperature at which a cleaning operation is conducted, the cleaning operation is conducted at a temperature in the range of from room temperature to 500.degree. C., a member whose surface is made of silicon carbide is used and a combined content of free silicon and free carbon in the surface region of the member is in the range of 2 wt % or less so that corrosion of the member is prevented.
REFERENCES:
patent: 4842897 (1989-06-01), Takeuchi et al.
patent: 4985114 (1991-01-01), Okudaira et al.
patent: 5294262 (1994-03-01), Nishimura
patent: 5443686 (1995-08-01), Jones et al.
Gupta Yogendra N.
Shin-Etsu Handotai & Co., Ltd.
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