Method and apparatus for testing the continuity of static random

Details Method and apparatus for testing the continuity of static random Method and apparatus for testing the continuity of static random

1991-12-31

1993-10-19

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

365190, 365203, 371 211, G11C 2900

Patent

active

052552306

ABSTRACT:
The method of testing a memory array of SRAM cells each of which includes memory transistors, bit and bit# lines, precharge circuitry, and an output test terminal involving the steps of connecting selected bit and bit# lines of selected SRAM cells to the output test terminal, disconnecting the memory transistors of the selected SRAM cells from the bit and bit# lines, disconnecting the bit and bit# lines from the precharge circuitry, enabling the column select circuitry to select the columns of the selected SRAM cells, applying a preselected level voltage to the output test terminal, and measuring any current which flows.

REFERENCES:
patent: 4956819 (1990-09-01), Hoffmann et al.
patent: 4958324 (1990-09-01), Devin
patent: 4999813 (1991-03-01), Ohtsuka et al.

Affiliated with

Also associated with

Rating

Method and apparatus for testing the continuity of static random does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing the continuity of static random, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing the continuity of static random will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1357616