Semiconductor integrated circuit and manufacturing method of the

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257356, H01L 2362

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active

058805010

ABSTRACT:
A dual diffusion layer composed of an n.sup.- type diffusion layer 5 and an n.sup.+ type diffusion layer 6 is formed in a first element forming region element-separated by a field oxidized film 2, a p.sup.+ type diffusion layer 7 is formed in a second element forming region, a p type guard ring layer 3 provided below the field oxidized film 2 and the cathode n.sup.+ type diffusion layer 6 are placed adjacent to each other, and thus reach-through breakdown voltage is made lower than that of an internal transistor.

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