Method of passivating semiconductor devices and the passivated d

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

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438762, 438767, 438771, H01L 21316

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active

058800298

ABSTRACT:
A method of passivating semiconductor devices including the steps of providing a semiconductor device having a surface of semiconductor material to be passivated, exposing the surface of semiconductor material to deep ultra-violet (DUV) radiation in an ambiance including oxygen so as to form a layer of oxide on the surface of semiconductor material, and forming a layer of passivation material on the layer of oxide. The DUV oxide forms a different interface with the semiconductor material which significantly improves operating characteristics of the semiconductor device.

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T. Matsuda et al., Jpn. J. Appl. Phys., 33(10)(Oct. 1994)5894 "Chemical composition . . . imporved by plasma and UV oxidation".
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Z.H. Lu et al. J. Vac. Sci. Technol. B 11(6)(Nov. 1993) 2033 "Ultraviolet-ozone oxidation of GaAs(100) and InP(100)".
S.W. King et al., MRS Symp. Proc. 345 (1996) 739 Ex situ and In situ methods for oxide and carbon removal . . . , Nov. 1995.

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