Test site for a charged coupled device (CCD) array

Details Test site for a charged coupled device (CCD) array Test site for a charged coupled device (CCD) array

1978-07-13

1980-04-01

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 365201, G01R 3102, G01R 3122

Patent

active

041963890

ABSTRACT:
Disclosed is a test site for an integrated circuit chip including a CCD register. Two serial CCD registers are spaced from each other at incrementally variable intervals. The first register receives a serial bit stream having a first binary value while the second serial register receives a bit stream having a second binary value. Data is transferred in parallel from the second register to determine the point at which the spacing between the two registers is sufficiently close to permit undesirable cross-talk.

REFERENCES:
patent: 3763480 (1973-10-01), Weimer
patent: 3790885 (1974-02-01), James
patent: 3815025 (1974-06-01), Jordan
patent: 4117546 (1978-09-01), Anantha et al.
patent: 4139910 (1979-02-01), Anantha et al.
Kosonocky et al.; "Basic Concepts of Charge-Coupled Devices;" RCA Review; Sep. 1975; pp. 586-592.

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