X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1998-11-16
2000-08-29
Bruce, David V.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 81, 378208, 206557, G01N 2300, B01L 300
Patent
active
06111930&
ABSTRACT:
A sample changer (2) for the automatic intake of a multitude of samples into the measurement position on the goniometer axis (a) of an X-ray diffractometer (20) in which the individual samples--each showing a surface, which meets the goniometer axis at a tangent in the measurement position--are linearly arranged on an insertable magazine (3). The samples on the magazine (3) can be moved in the direction of the goniometer axis (a) in order to transport each sample translationally into the measurement position. Furthermore the sample changer (2), the magazine (3) and the mountings (10) show recesses, which allow the refracted X-ray beams from the sample in transmission mode to pass through to the detector (14) unimpeded. The sample changer is suitable for reflection mode as well as transmission mode measurements without having to redesign the system.
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"Rontgendiffraktometer D 5000" by Siemens AG, 1995, Section 3.4.3, p. 3-21.
"MX Labo Genius X-ray Diffractometer", company brochure of MAC Science Co. Ltd., Yokohama, Japan.
"X-ray Diffractometer Accessories", company brochure of Scintag, Inc., Santa Clara, USA.
Photo of automatic sample changer for an X-ray diffractometer based on a robot arm offered by STOE & Cie. GmbH, Darmstadt, Germany.
Bruce David V.
Bruker AXS Analytical X-Ray Systems GmbH
Dunn Drew A.
Vincent Paul
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