4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Bruker AXS Analytical X-Ray Systems GmbH

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Automatic sample changer for an X-ray diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Compact X-ray spectrometer

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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Simultaneous x-ray fluorescence spectrometer

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-ray analysis apparatus with a graded multilayer mirror

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray analysis device with X-ray optical semi-conductor...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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