Non-destructive method and circuit to determine the programmabil

Details Non-destructive method and circuit to determine the programmabil Non-destructive method and circuit to determine the programmabil

1985-12-23

1988-01-05

Hecker, Stuart N.

Static information storage and retrieval

Read/write circuit

Testing

365 96, 371 21, G11C 2900, G11C 1700

Patent

active

047180420

ABSTRACT:
In a one time programmable memory device having a memory cell, a programmable device in the memory cell having a high initial resistance, a user readable circuit for reading the condition of the programmable device, and capacitance coupled with the initial resistance and having an RC time constant therewith, a circuit and its method for non-destructively testing the programmability of the programmable device. A switch device is included in the user readable circuit and is connected to the capacitance. The switch device has a first condition for discharging the capacitance and a second condition for allowing the capacitance to charge through the programmable device. An output circuit in the user readable circuit indicates when the charge on the capacitance reaches a predetermined threshold. A test enabling element is responsive to a test enable signal for selectively changing the switch device between its second condition and its first condition to conduct a test for measuring the RC time constant, thereby testing the programmability of the programmable device.

REFERENCES:
patent: 4272833 (1981-06-01), Taylor
patent: 4418403 (1983-11-01), O'Toole et al.
patent: 4459694 (1984-07-01), Veno et al.
patent: 4488262 (1984-12-01), Basire et al.
patent: 4638243 (1987-01-01), Chan

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