Field-effect transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257336, 257344, H01L 2976, H01L 2994

Patent

active

059628987

ABSTRACT:
A field-effect transistor (10, FIG. 2) possesses improved electrostatic discharge characteristics. The transistor (10), formed in a p-type semiconductor substrate, comprises a gate (16) that forms a channel between two adjacent n-regions (12 and 14). At least one of the n-regions (12) has an n-well (22) below and centered about a contact pad (18). The n-well (22) has a second lower concentration of n-type impurities than either of the n-regions.

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Lin et al, "A CMOS VLSI Eds Input Protection Device, DIFIDW", Electrical Overstress/Electrostatic Discharge Symposium Proceedings, The EOS/ESD Association and IIT Research Institute, No. EOS-6, Oct. 2, 3, 4, 1984, pp. 202-209.

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