Method of selectively forming a contact in a contact hole

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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Details

438649, 438630, 438682, 438683, 438664, H01L 214763

Patent

active

061001864

ABSTRACT:
A contact is selectively formed in a contact hole in an insulating layer deposited on a silicon substrate. The contact hole exposes a portion of the substrate. The contact is formed by selectively forming a first layer of titanium silicide in the contact hole on the exposed portion of the substrate. A layer of titanium nitride is then selectively formed on the first layer of titanium silicide. A second layer of titanium silicide is thereafter selectively formed on the layer of titanium nitride to form the contact.

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