Semiconductor device having a thin film transistor and thin film

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Field effect device in non-single crystal – or...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257350, 257 69, 257354, 257359, H01L 2978

Patent

active

055896944

ABSTRACT:
Amorphous silicon in impurity regions (source and drain regions or N-type or p-type regions) of TFT and TFD are crystallized and activated to lower electric resistance, by depositing film having a catalyst element such as nickel (Ni), iron (Fe), cobalt (Co) or platinum (Pt) on or beneath an amorphous silicon film, or introducing such a catalyst element into the amorphous silicon film by ion implantation and subsequently crystallizing the same by applying heat annealing at an appropriate temperature.

REFERENCES:
patent: 4769686 (1988-09-01), Horiuchi et al.
patent: 4894699 (1990-01-01), Hayashi et al.
patent: 4912061 (1990-03-01), Nasr
patent: 5147826 (1992-09-01), Liu et al.
patent: 5229625 (1993-07-01), Suzuki et al.
patent: 5275851 (1994-01-01), Fonash et al.
patent: 5418389 (1995-05-01), Watanabe
patent: 5426064 (1995-06-01), Zhang et al.
patent: 5488000 (1996-01-01), Zhang et al.
"Crystallized Si Films By Low-Temperature Rapid Thermal Annealing of Amorphous Silicon", R. Kakkad, J. Smith, W. S. Lau, S. J. Fonash, J. Appl. Phys. 65 (5), Mar. 1, 1989, 1989 American Institute of Physics, pp. 2069-2072.
"Polycrystalline Silicon Thin Film Transistors on Corning 7059 Glass Substrates Using Short Time, Low Temperature Processing", G. Liu, S. J. Fonash, Appl. Phys. Lett. 62 (20), May 17, 1993, 1993 American Institute of Physics, pp. 2554-2556.
"Selective Area Crystallization of Amorphous Silicon Films by Low-Temperature Rapid Thermal Annealing", Gang Liu and S. J. Fonash, Appl. Phys. Lett. 55 (7), Aug. 14, 1989, 1989 American Institute of Physics, pp. 660-662.
"Low Temperature Selective Crystallization of Amorphous Silicon", R. Kakkad, G. Liu, S. J. Fonash, Journal of Non-Crystalline Solids, vol. 115, (1989), pp. 66-68.
C. Hayzelden et al., "In Situ Transmission Electron Microscopy Studies of Silicide-Mediated Crystallization of Amorphous Silicon" (3 pages).
A. V. Dvurechenskii et al., "Transport Phenomena in Amorphous Silicon Doped by Ion Implantation of 3d Metals", Akademikian Lavrentev Prospekt 13, 630090 Novosibirsk 90, USSR, pp. 635-640.
T. Hempel et al., "Needle-Like Crystallization of Ni Doped Amorphous Silicon Thin Films", Solid State Communications, vol. 85, No. 11, pp. 921-924, 1993.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having a thin film transistor and thin film does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having a thin film transistor and thin film, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having a thin film transistor and thin film will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1143758

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.