Method of contact structure formation

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438624, 438638, 438672, H01L 214763

Patent

active

06121129&

ABSTRACT:
A method of forming a semiconductor structure having features of differing sizes, includes forming a first layer on a semiconductor substrate; patterning only a first plurality of features of a first feature size on the first layer; removing portions of the first layer, the portions corresponding to the first plurality of features, filling the first plurality of openings; forming a second layer, the second layer overlying the first layer and the filled openings; patterning a second plurality of features of a second feature size on the second layer; removing portions of the first layer and second layer, the portions corresponding to the second plurality of features, the second plurality of openings extending through the first and second layers, and filling the second plurality openings.

REFERENCES:
patent: 4855252 (1989-08-01), Peterman et al.
patent: 5100812 (1992-03-01), Yamada et al.
patent: 5126006 (1992-06-01), Cronin et al.
patent: 5189506 (1993-02-01), Cronin et al.
patent: 5210053 (1993-05-01), Yamagata
patent: 5266446 (1993-11-01), Chang et al.
patent: 5275963 (1994-01-01), Cederbaum et al.
patent: 5354712 (1994-10-01), Ho et al.
patent: 5424154 (1995-06-01), Borodovsky
patent: 5472814 (1995-12-01), Lin
patent: 5479054 (1995-12-01), Tottori
patent: 5563012 (1996-10-01), Neisser
patent: 5760429 (1998-06-01), Yano et al.
patent: 5792703 (1998-08-01), Bronner et al.
F. White, ert al. "Damascene Stud Local Interconnect in CMOS Technology", IEEE IEDM Tech. Digest, Apr. 1992, pp. 301-303.
T. Tang, et al. "Titanium Nitride Local Interconnect Technology for VLSI", IEEE Transactions on Electron Devices, vol. ED-34, No. 3, Mar. 1987; pp. 682-687.
W. Lynch, "Self-Aligned Contact Schemes for Source-Drains in Submicron Devices", IEEE IEDM Tech. Digest, Dec. 1987, pp. 354-357.
R. D. J. Verhaar, et al. "A 25 um2 Bulk Full CMOS Stram Cell Technology with Fully Overlapping Contacts", IEEE IEDM Tech. Dig., Dec. 1990, pp. 473-476.
IBM Technical Disclosure Bulletin; vol. 24 No. 11B Apr., 1982 "Contact Via Etch Masks for Double-Polysilicon Process" by A. S. Bergendahl, pp. 5903-5904.
EPO Search Report dated Jan. 12, 1998, 97310318.7-2203.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of contact structure formation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of contact structure formation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of contact structure formation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1072539

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.