Pulling processes and equipment for growing silicon crystals hav

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156606, 156DIG89, 148DIG41, C30B 1514, C30B 1520

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active

047055910

ABSTRACT:
Silicon crystals with high and controlled predictable carbon content can be grown by controlling oxygen introduced into the pulling chamber during the melting in standard Czochralski silicon crystal pullers.
Carbon concentration profile of grown crystals can be deduced from the carbon monoxide [CO] concentration real time monitoring, through its integral taken during the whole pulling duration. This process is reproducible, and the carbon content in the silicon is consistent. Means to practice this method are also disclosed.

REFERENCES:
patent: 4400232 (1983-08-01), Ownby et al.
patent: 4415401 (1983-11-01), Wald et al.
patent: 4443411 (1984-04-01), Kalejs
patent: 4591409 (1986-05-01), Ziem et al.
Ahlgren et al, "Increasing Carbon Content in Czochralski Grown Crystals", IBM-TDB, vol. 25, No. 3A, Aug. 1982, pp. 962-963.
Endo et al, "Equilibrium of Carbon and Oxygen in Silicon and Carbon Monoxide in Ambient Atmosphere", Journal of Electrochemical Society, Aug. 1979, vol. 126, No. 8, pp. 1422-1425.

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