Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1998-12-02
2000-01-04
Chapman, John E.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
360280, G01P 15125
Patent
active
060097531
ABSTRACT:
A monolithic capacitance-type microstructure includes a semiconductor substrate, a plurality of posts extending from the surface of the substrate, a bridge suspended from the posts, and an electrically-conductive, substantially stationary element anchored to the substrate. The bridge includes an element that is laterally movable with respect to the surface of the substrate. The substantially stationary element is positioned relative to the laterally movable element such that the laterally movable element and the substantially stationary element form a capacitor. Circuitry may be disposed on the substrate and operationally coupled to the movable element and the substantially stationary element for processing a signal based on a relative positioning of the movable element and the substantially stationary element. A method for fabricating the microstructure and the circuitry is disclosed.
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Brokaw A. Paul
Core Theresa A.
Sherman Steven J.
Tsang Robert W. K.
Analog Devices Inc.
Chapman John E.
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