Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent
1998-08-19
2000-12-26
De Cady, Albert
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
365201, 365222, G11C 2900
Patent
active
06167544&
ABSTRACT:
A method and apparatus for reducing the time for determining a memory refresh frequency for a dynamic random access memory. The method includes disabling the bootstrap circuitry associated with a word line when writing data into a memory cell during a test operation. For instances in which data representing a high logic level is written into the memory cell, the resulting charge that is stored is less than the stored charge under normal operation of the dynamic memory. Consequently, the decay time for the stored charge is shortened, thereby shortening the time for testing the refresh frequency of the memory cell. Testing time for the dynamic memory is thus reduced.
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EPO; "European Search Report"; EPO Appl. No. EP 99 30 6571; Feb. 4, 2000; pp. 1-3.
Cady Albert De
Chase Shelly A
Galanthay Theodore E.
Jorgenson Lisa K.
STMicroelectronics Inc.
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