4. Optics: measuring and testing
  5. By configuration comparison
  6. With photosensitive film or plate

Yuki Toriumi

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Aligning method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method and apparatus for measuring the thickness of a thin film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Press apparatus for planar members

Adhesive bonding and miscellaneous chemical manufacture – Methods – Surface bonding and/or assembly therefor
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Profile ID: LFUS-PAI-P-578796

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