4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. Utilizing a spectrometer

Yuji Hirao

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Method of and apparatus for determining residual damage to wafer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Method of and apparatus for measuring lifetime of carriers in se

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-1295649

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