4. Thermal measuring and testing
  5. Temperature measurement
  6. By electrical or magnetic heat sensor

Yoshinobu Satoh

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Contact-type thermometer

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent

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SOI semiconductor device having gettering layer and method...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – And gettering of substrate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1897572

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