4. Optical: systems and elements
  5. Compound lens system
  6. Microscope

Yoshimitsu Enomoto

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Atomic force microscope

Optical: systems and elements – Compound lens system – Microscope
Patent

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Cantilever for a scanning probe microscope and a method of manuf

Measuring and testing – Surface and cutting edge testing – Roughness
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Profile ID: LFUS-PAI-P-1269929

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