Optics: measuring and testing
By polarized light examination
Of surface reflection
Inventor
active
Measuring method, analyzing method, measuring apparatus,...
Method for analyzing thin-film layer structure using...
Sample analysis method
Thin-film characteristic measuring method using...
No associations
LandOfFree
Yoko Wasai does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Yoko Wasai, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Yoko Wasai will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-3051029