4. Electric heating
  5. Heating devices
  6. Combined with container, enclosure, or support for material...

Yoichi Nakagomi

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Method and apparatus for probe testing substrate

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Semiconductor wafer holder with spring-mounted temperature measu

Electric heating – Heating devices – Combined with container – enclosure – or support for material...
Patent

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Temperature managing apparatus for multi-stage container

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1497179

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