4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Yoav Hollander

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Method and apparatus for test generation during circuit design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for test generation during circuit design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for test generation during circuit design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and system for automatically creating tests

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging
Reexamination Certificate

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System and method for measuring temporal coverage detection

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2109731

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