4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Yi-Chun Tsai

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Method for tuning parameters in memory and computer system...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Test wafer usage forecast modeling method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2840980

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