4. Coded data generation or conversion
  5. Converter calibration or testing

Yasusuke Suzuki

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DAC with feedback control for current source bias during non-dis

Coded data generation or conversion – Converter calibration or testing
Patent

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Semiconductor device having dual-STI and manufacturing...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-377785

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