4. Image analysis
  5. Pattern recognition
  6. Template matching

Yasushi Sasa

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Apparatus and method for detecting defects in periodic...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Defect inspection apparatus, defect inspection method and...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Pattern inspection apparatus and method

Image analysis – Pattern recognition – Template matching
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2959387

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