4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Bore inspection

Yasuomi Kaneuchi

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Laser light source

Coherent light generators – Particular beam control device – Control of pulse characteristics
Reexamination Certificate

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Via hole depth detector

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
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Wafer processing method

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
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Profile ID: LFUS-PAI-P-3162649

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