4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. Specified electrical sensor or system

Yasuo Osone

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Flat semiconductor device and power converter employing the...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With large area flexible electrodes in press contact with...
Reexamination Certificate

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Method of measuring thermal resistance of resin and a...

Thermal measuring and testing – Determination of inherent thermal property
Reexamination Certificate

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Physical sensor and method of process

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For high frequency device
Reexamination Certificate

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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With provision for cooling the housing or its contents
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2319104

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