4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Yasumitsu Oki

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Method for testing semiconductor device and semiconductor...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor memory device having reduced leakage current

Static information storage and retrieval – Systems using particular element – Flip-flop
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Profile ID: LFUS-PAI-P-2054213

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