4. Etching a substrate: processes
  5. Etching of semiconductor material to produce an article...

Yaping Hua

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Method of etching a deep trench in a substrate and method of...

Etching a substrate: processes – Etching of semiconductor material to produce an article...
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Method of wafer-level packaging using low-aspect ratio...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Single chip tri-axis accelerometer

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
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Profile ID: LFUS-PAI-P-2711853

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