4. Image analysis
  5. Learning systems
  6. Trainable classifiers or pattern recognizers

Won Hyung Lee

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Method for atomic layer deposition (ALD) of silicon oxide film

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
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Method for manufacturing semiconductor device

Coating processes – Coating by vapor – gas – or smoke
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Video fingerprinting apparatus in frequency domain and...

Image analysis – Learning systems – Trainable classifiers or pattern recognizers
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Profile ID: LFUS-PAI-P-2210112

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