4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

William Cote

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Cu/low-k BEOL with nonconcurrent hybrid dielectric interface

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Method for reducing amine based contaminants

Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate

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Slurry for mechanical polishing (CMP) of metals and use thereof

Cleaning compositions for solid surfaces – auxiliary compositions – Cleaning compositions or processes of preparing – For cleaning a specific substrate or removing a specific...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2599190

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