4. Chemistry: electrical and wave energy
  5. Processes and products

Willi Steegmuller

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Apparatus for measuring the thickness of thin layers

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source
Patent

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Device for measuring thin films by means of beta radiation

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source
Patent

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Method of measuring thickness of a tin layer and thickness measu

Chemistry: electrical and wave energy – Processes and products
Patent

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Profile ID: LFUS-PAI-P-1089113

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