4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Wilfried Daehn

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Integrated memory and method for checking the operation of...

Static information storage and retrieval – Read/write circuit – Testing
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Method and apparatus for processing defect addresses

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for checking the functioning of memory cells of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2443217

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