4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Volentine Francos & Whitt,pllc

Law Firm

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Law Firm

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Method of forming a contact in a semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Probe needle test apparatus and method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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