4. Television
  5. Special applications
  6. Manufacturing

Victoria Jean Bruce

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De broglie microscope

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Energy resolved emission microscopy system and method

Television – Special applications – Manufacturing
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Method for etching a flip chip using secondary particle...

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate

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Semiconductor structure with a backside protective layer and...

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1784217

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