4. Thermal measuring and testing
  5. Thermal testing of a nonthermal quantity
  6. Of susceptibility to thermally induced deteriouration, flaw,...

Tze-Zen Chien

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Furnace for testing integrated circuits

Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
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Overvoltage protector of a burn-in board

Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific voltage responsive fault sensor
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Profile ID: LFUS-PAI-P-2079221

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