4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Tzach Schechner

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Dynamically interleaving randomly generated test-cases for...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Highly specialized scenarios in random test generation

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Methods and apparatus for action regulation for continuous...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2390328

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