4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Toshihiko Yokota

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Circuit for controlling voltage fluctuation in integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic transformation and gate placement to avoid routing...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2175839

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