4. Electricity: measuring and testing
  5. Plural, automatically sequential tests

Toru Hiyama

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Logic circuit having a test data scan circuit

Electricity: measuring and testing – Plural – automatically sequential tests
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Method of supporting arrangement of semiconductor integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1359325

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