4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital data error correction

Tonomi Egawa

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Multi-value type semiconductor memory device and its defect...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Semiconductor memory device

Static information storage and retrieval – Floating gate – Multiple values
Reexamination Certificate

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Semiconductor memory device and method for reading data

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2096546

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